The optical microscope, often referred to as the "light mocroscope", is a type of microscope which uses
visible light?and a system of?lenses?to magnify images of small samples.
A scanning electron microscope (SEM) is a type of electron microscope that images a sample by scanning
it with a high-energy beam of?electrons in a raster scan pattern.
The electrons interact with the atoms that make up the sample producing signals that contain
information about the sample's surface?topography, composition, and other properties such as?electrical
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of
scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer,
more than 1000 times better than the optical diffraction limit.
HP/Agilent 4145B semiconductor analyzer is fully automatic, high-speed DC characterization of
semiconductor devices. Sourcing and measurement 50 fA to 100 mA and 1 mV to 100 V. Up to 1140
measurement and display points for precise measurement and analysis. Flexible graphic analysis for
quick parameter extraction. Built-in 3 1/2-inch disk drive for storage of 240 user programs or 105
measurement results. HP-IB.
The Model 2400 SourceMeter solution is a 20W instrument that allows sourcing and measuring voltage
from ±5μV (sourcing) and ±1μV (measuring) to ±200V DC and current from ±10pA to ±1A. It's well-suited
for testing a wide range of devices, including diodes, resistors, resistor networks, active circuit protection
devices, and portable battery-powered devices and components. It's also useful for systems power
sourcing and IDDQ testing applications.
The 5-1/2 digit Model 6485 Picoammeter combines Keithley's expertise in sensitive current measurement
instrumentation with enhanced speed and a robust design. With eight current measurement ranges and
high speed autoranging, this cost-effective instrument can measure currents from 20fA to 20mA, taking
measurements at speeds up to 1000 readings per second.