The optical microscope, often referred to as the "light mocroscope", is a type of microscope which uses
visible light?and a system of?lenses?to magnify images of small samples.
A scanning electron microscope (SEM) is a type of electron microscope that images a sample by scanning
it with a high-energy beam of?electrons in a raster scan pattern.
The electrons interact with the atoms that make up the sample producing signals that contain
information about the sample's surface?topography, composition, and other properties such as?electrical
conductivity.

• Optical microscope
• Portable Scanning Electron Microscope

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of
scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer,
more than 1000 times better than the optical diffraction limit.
HP/Agilent 4145B semiconductor analyzer is fully automatic, high-speed DC characterization of
semiconductor devices. Sourcing and measurement 50 fA to 100 mA and 1 mV to 100 V. Up to 1140
measurement and display points for precise measurement and analysis. Flexible graphic analysis for
quick parameter extraction. Built-in 3 1/2-inch disk drive for storage of 240 user programs or 105
measurement results. HP-IB.

• Atomic Force Microscope
• HP/Agilment 4145B Semiconductor Analyzer

The Model 2400 SourceMeter solution is a 20W instrument that allows sourcing and measuring voltage
from ±5μV (sourcing) and ±1μV (measuring) to ±200V DC and current from ±10pA to ±1A. It's well-suited
for testing a wide range of devices, including diodes, resistors, resistor networks, active circuit protection
devices, and portable battery-powered devices and components. It's also useful for systems power
sourcing and IDDQ testing applications.
The 5-1/2 digit Model 6485 Picoammeter combines Keithley's expertise in sensitive current measurement
instrumentation with enhanced speed and a robust design. With eight current measurement ranges and
high speed autoranging, this cost-effective instrument can measure currents from 20fA to 20mA, taking
measurements at speeds up to 1000 readings per second.

• KEITHLEY 2400 sourcemeter
• KEITHLEY 6485 picoammeter